Today, thermographic damage and function analysis of electronic components is an established test method in electrical engineering. This method is also used for research purposes at the Institute for Electrical Systems and Energy Logistics at BTU Cottbus-Senftenberg. In this context, Prof. Dr. Ralph Schacht is intensively involved with the material and system characterisation as well as the non-destructive failure analysis of printed circuit boards, electronic components, microelectronics as well as composite systems of packaging and interconnection technology.